- 產(chǎn)品型號：
- UB－6200半導(dǎo)體晶體集成電路檢測用顯微鏡
- 類型：
- 金相顯微鏡
工業(yè)顯微鏡廣泛應(yīng)用于半導(dǎo)體,電子工業(yè)進行晶體,集成電路的檢驗和科學(xué)研究. 配備有反射照明,成象和觀察系統(tǒng),偏光裝置. Industrial microscope is widely used for crystal, integrated circuit (IC) examination and research. It is supplied with reflected illumination, imaging and viewing system, polarized imaging system. 規(guī)格 Specifications ◇ 無限遠(yuǎn)光學(xué)系統(tǒng),管鏡焦距200mm Infinitive Optical System, Tube Lens Focal Length 200mm ◇ 鉸鏈?zhǔn)饺跨R筒,30°傾斜, 瞳距55-75mm Compensation Free Trinocular Tube, Inclined at 30°, Interpupillary Distance 55-75mm ◇ 高眼點,大視場目鏡WF10X/22 High Point and Wide Field Eyepiece WF10/22 ◇ 長工作距離,平場復(fù)消色差物鏡2X/0.055, 5X/0.14, 10X/0.28, 20X/0.29, 50X/0.42 Long Working Distance, Plan Apo Objectives 2X/0.055, 5X/0.14, 10X/0.28, 20X/0.29, 50X/0.42 ◇ 五孔物鏡轉(zhuǎn)換器 Quintuple Nosepiece ◇ 6″雙層活動平臺和圓平臺 6″Double Layers Mechanical Stage and circle stage ◇ 同軸粗微調(diào)焦機構(gòu),微動格值0.002mm Coaxial Coarse & Fin Focus Adjustment System, Fine Division 0.002mm ◇照明系統(tǒng) Illumination System 冷光源光纖反射照明器:12V150W Cold Light Fiber Reflected Illnminator: 12V150W
